photovoltaic panel

Product Qualification Program (PQP)

Kiwa PVEL’s Product Qualification Program (PQP) is a key tool for mitigating PV module procurement risk by transforming industry-leading bankability testing into procurement intelligence. Learn more about our PQP methodology, PQP test details and procedures, and case studies from the lab and the field here.

Receive a quote tailored to your needs

PQP Methodology and Why Testing Matters
WL 2.jpg

Kiwa PVEL’s approach to testing and benchmarking PV module reliability has been our key focus for more than a decade. The PQP results enable data-driven solar procurement and investments for developers, financiers, and asset owners. Learn more about our testing methodology and why PQP testing matters here.

Learn more

Manufacturer Sign-up
utility scale zoomed in rows with sunshine.jpg

Kiwa PVEL’s PQP and Scorecards help manufacturers reach new buyers and demonstrate the quality of their products. Ready for your company’s PV modules to appear in Kiwa PVEL’s next Scorecard? Contact us to sign up for testing.
Learn more

Thermal Cycling
image928n.png

The Thermal Cycling (TC) test assesses a PV module’s ability to endure changes in temperature.

Learn more

Damp Heat
IMG_8508.JPG

The Damp Heat (DH) test simulates long-term exposure to high temperatures and high humidity conditions.

Learn more

Mechanical Stress Sequence
_NZ97047 (1).jpg

The Mechanical Stress Sequence (MSS) tests the mechanical durability of the PV module’s glass, frames and cells.

Learn more 

Hail Stress Sequence
_NZ97140.jpg

The Hail Stress Sequence (HSS) subjects PV modules to extreme hail impacts and tests for subsequent power loss.

Learn more

Potential-Induced Degradation
PID Chambers.jpg

Potential-induced degradation (PID) tests for power loss that can occur at high voltages between the cells and PV module frames.

Learn more

LID and LETID
_NZ96590-Edit.jpg

Light-induced degradation (LID) and light-and-elevated temperature-induced degradation (LETID) testing quantifies PV module susceptibility to these early-life power loss mechanisms.

Learn more

UV-Induced Degradation
Backsheet Testing_EDIT.jpg

Ultraviolet light-induced degradation (UVID) testing reveals how stable the PV module is under UV irradiation.

Learn more

Backsheet Durability Sequence
_NZ96949.jpg

The Backsheet Durability Sequence (BDS) assesses vital reliability risks for PV module backsheets including yellowing and polymer cracking.

Learn more

PAN and IAM
Houser_190222_1479.jpg

PAN and IAM testing measures PV module performance at different temperature, irradiance and light angle conditions.

Learn more

Field Exposure
IMG_E3336 (cropped).JPG

The Field Exposure (FE) test provides an indication of real-world module performance over one year of outdoor conditions.

Learn more

PV Module Reliability Scorecard

Now available, the 10th Edition of Kiwa PVEL’s PV Module Reliability Scorecard features Top Performers from the industry’s best manufacturers and is the essential resource for PV module reliability and performance insights.

PVEL_ScorecardMicrosite_LaptopMockup_B_240603_v1.png

Access it now